Edxrf Analyzer - Silicon Drift Detector With Peltier Cooling, Portable For Material Composition & Plating Analysis
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Product Specifications
| Detector Type | SDD |
| Resolution | 160 eV |
| Cooling | Peltier-cooled |
| Weight | 2 kg |
| Dimensions | 20x10x5 cm |
| Power | Rechargeable battery |
| Usage | Material composition analysis, plating solution analysis, RoHS compliance testing, and multi-layer plating thickness measurement. |
| Compliance | CE, RoHS |
| Features | Portable, EDXRF, Fast analysis, Precise results, RoHS compliant, Easy to use |
Product Overview
Key Features
Portable Energy Dispersive X-Ray Fluorescence measuring instrument (EDXRF) for Material Composition Analysis, Plating Solution Analysis, Trace Analysis for RoHS Compliance & Multi-layer Plating Thickness Measurement. It has Silicon Drift Detector (SDD) which is Peltier-cooled with Resolution (fwhm for Mn-KI ) a 160 eV. Typical fields of applications are;
a c Measurements on large coated parts, like machine components and housings
a c Mobile measurements in electroplating shops
a c Mobile measurements of precious metals
a c Determination of the composition of electroplating baths (Solution analysis)
Company Details
Focusing on a customer-centric approach, Fischer Measurement Technologies (India) Pvt. Ltd. has a pan-India presence and caters to a huge consumer base throughout the country. Buy Testing & Measuring Equipment in bulk from Fischer Measurement Technologies (India) Pvt. Ltd. at Trade India quality-assured products.
Business Type
Exporter, Importer, Manufacturer, Supplier, Trading Company
Employee Count
80
Establishment
2006
Working Days
Monday To Saturday
GST NO
27AAACF9487H1Z6
Payment Mode
Telegraphic Transfer (T/T)
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Seller Details
GST - 27AAACF9487H1Z6
RatingNew Delhi, Delhi
Regional Manager - North India
Mr Smruti Ranjan Pati
Address
DSM No. 244, 2nd Floor, DLF Towers, 15-Shivaji Marg, Moti Nagar, New Delhi, Delhi, 110015, India
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