Edxrf Analyzer - Silicon Drift Detector With Peltier Cooling, Portable For Material Composition & Plating Analysis

We are producing and supplying of XRF Analyzer to our consumers.
Portable Energy Dispersive X-Ray Fluorescence measuring instrument (EDXRF) for Material Composition Analysis, Plating Solution Analysis, Trace Analysis for RoHS Compliance & Multi-layer Plating Thickness Measurement. It has Silicon Drift Detector (SDD) which is Peltier-cooled with Resolution (fwhm for Mn-KI ) a 160 eV. Typical fields of applications are;
a c Measurements on large coated parts, like machine components and housings
a c Mobile measurements in electroplating shops
a c Mobile measurements of precious metals
a c Determination of the composition of electroplating baths (Solution analysis)