Fischerscope X-ray Xuv 773

To fulfill the various demands of the clients, we are indulged in manufacturing, importing, trading and supplying a supreme quality assortment of FISCHERSCOPE X-RAY XUV 773 in New Delhi, Delhi, India.
FISCHERSCOPE X-RAY XUV 773 Energy dispersive X-ray fluorescence (ED-XRF) measuring instrument is used
a c For analysis and coating thickness measurement on thin coatings like CIGS, CIS, CdTe.
a c For analysis and coating thickness measurement on functional coatings and in electronic and semiconductor industries
a c For non-destructive analysis of gold, jewelry and gem stones
a c For trace analysis and harmful substance analysis, RoHS, WEEE
a c To analyze thin coatings, small structures, trace elements and alloys.
a c To analyze 24 elements simultaneously from Sodium Na (11) to Uranium U (92).