
Fischerscope X-ray Xuv 773
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Product Specifications
| Dimensions | 50x40x60 cm |
| Weight | 50kg |
| Materials | Steel, Aluminum |
| Power | 220V |
| X-ray source | 50kV |
| Detector | Si-PIN |
| Software | WinXP |
| Features | ED-XRF analysis, Coating thickness, Non-destructive, Trace analysis, Alloy analysis, Simultaneous analysis, RoHS compliant, High precision |
Product Overview
Key Features
FISCHERSCOPE X-RAY XUV 773 Energy dispersive X-ray fluorescence (ED-XRF) measuring instrument is used
a c For analysis and coating thickness measurement on thin coatings like CIGS, CIS, CdTe.
a c For analysis and coating thickness measurement on functional coatings and in electronic and semiconductor industries
a c For non-destructive analysis of gold, jewelry and gem stones
a c For trace analysis and harmful substance analysis, RoHS, WEEE
a c To analyze thin coatings, small structures, trace elements and alloys.
a c To analyze 24 elements simultaneously from Sodium Na (11) to Uranium U (92).
Company Details
Focusing on a customer-centric approach, Fischer Measurement Technologies (India) Pvt. Ltd. has a pan-India presence and caters to a huge consumer base throughout the country. Buy X-Ray Machine in bulk from Fischer Measurement Technologies (India) Pvt. Ltd. at Trade India quality-assured products.
Business Type
Exporter, Importer, Manufacturer, Supplier, Trading Company
Employee Count
80
Establishment
2006
Working Days
Monday To Saturday
GST NO
27AAACF9487H1Z6
Payment Mode
Telegraphic Transfer (T/T)
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Seller Details
GST - 27AAACF9487H1Z6
New Delhi, Delhi
Regional Manager - North India
Mr Smruti Ranjan Pati
Address
DSM No. 244, 2nd Floor, DLF Towers, 15-Shivaji Marg, Moti Nagar, New Delhi, Delhi, 110015, India
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