Mixed Signal In-circuit Functional Tester (Qt-8200m)

Our firm is offering Mixed Signal In-Circuit Functional Tester (QT-8200M) to our consumers. QT8200M comes with large device library written in QDDL / VHDL and PythonTD languages for In-Circuit and out of Circuit Testing of devices. While testing devices in-circuit, QT8200M employs the auto-compensation technique.
When any of the inputs are linked together or connected to the power pins, the drive pattern or Test Vector is modified on the fly depending upon the In-Circuit links of the device under test.
The Qmax simulator simulates the output response on the new modified test vector. This is essential to avoid any clash between the pin drivers driving these pins with different logic levels at the same time.
QT8200M can test any Digital device in in-circuit for its functionality using library defined test patterns. The ICFT mode allows interactive testing of the individual devices, as well as whole board, comprising various devices. Clock Terminator test avoids False Alarm and ensures highest possible fault coverage on a wide range of boards.
QT8200M offers powerful Automatic Guarding Guide, while testing a BUS device such as Tri-state / bidirectional/ O.C. / O.E. device, it is required to guard the device under test by disabling other BUS devices present in the BUT which are on the same BUS.
QT8200M has auto guarding facility which lists the IC and the pins of those devices which may need to be guarded.