Equotip 550 Leeb Hardness Tester - 250x162x62mm, Grey | Automatic Hardness Testing, Touch Screen Interface, Future-proof Design

Equotip 550 Leeb Hardness Tester is the most versatile all-in-one solution for portable hardness testing. The Leeb hardness principle is based on the dynamic (rebound) method and is best suited for on-site testing of heavy, large or already installed parts. In combination with the Equotip Portable Rockwell Probe, the Equotip 550 can be extended with the traditional Rockwell static test method. This additionally allows automatic on-site correlation of Leeb to Portable Rockwell true indention hardness value.The new generation Equotip Touch screen interface is specifically designed to provide an exceptional user experience. The enhanced software provides interactive wizards, automatic verification processes, personalization options and custom report functions. Furthermore, it is compatible with upcoming developments.

Equotip Leeb:
Automatic conversions to all common hardness scales (HV, HB, HRC, HRB, HRA, HS, Rm) as required
Highly accurate A 4 HL (0.5% at 800 HL) with automatic correction for impact directions
Wide measurement range with a variety of impact devices and support rings to serve most hardness testing requirements
Extensive range of precise hardness test blocks available for each impact device with different hardness levels for regular verification

Equotip 550 Touch Screen Unit:
7a color display 800x480 pixels
Modular concept: Flexible configuration for various industry applications with a wide range of probes and accessories
Combined method: Automatic on-site correlation of Leeb to Portable Rockwell true indention hardness value
Guiding wizards: Predefined workflows to increase process reliability and to improve measurement precision
Automatic verification: Step by step verification in line with ISO 16859 and ASTM A956
Interactive guides: On-screen notifications to obtain the most relevant settings for your application
Conversion curves: Create, edit and verify material conversion curves directly on the instrument
Custom reports: Modular generator allows customized measurement reports
Automation option: Integration of NDT automation into quality management systems and automated testing environments
Housing specially designed to be used on-site in harsh environments (IP 54), including carrying strap, integrated stand and sunshield cover
High resolution color display
Battery lifetime of > 8h
8 GB Flash memory
Dual core processor supporting diverse communication and peripheral interfaces: Probe Connector, USB Host, USB Device and Ethernet
Future proof investment through direct compatibility with upcoming developments

Standards:
ASTM A956 / E140 / A370 , ISO EN 16859 (publication upcoming), DIN 50156, GB/T 17394, JB/T 9378

Equotip Leeb Impact Devices:
Measuring range: 1-999 HL
Measuring accuracy: A 4 HL (0.5 % at 800 HL)
Resolution: 1 HL; 1 HV; 1 HB; 0.1 HRA; 0.1 HRB; 0.1 HRC; 0.1 HS; 1 MPa (N/mm2)
Impact direction: Automatic compensation (excl. DL probe)
Impact energy: - 11.5 Nmm for D, DC, E, S probes
- 11.1 Nmm for DL probe
- 3.0 Nmm for C probe
- 90.0 Nmm for G probe
Ball indenter : - Tungsten carbide, 3.0 mm dia for C, D, DC probes
- Tungsten carbide, 2.78 mm dia for DL probe
- Tungsten carbide, 5.0 mm dia for G probe
- Ceramics, 3.0 mm dia for S probe - Polycrystalline diamond, 3.0 mm dia for E probe
Operating temperature : 10C to 50C