Th2638 High Speed Precision Capacitance Meter Upto 1mhz

TH2638:100Hz,120Hz,1kHz,10kHz,100kHz,1MHz,1MHzA 1%,1MHzA 2%
TH2638A:100Hz,120Hz,1kHz,10kHz,40kHz,100kHz
TH2638B:100Hz,120Hz, 1kHz,10kHz
TH2638C:100Hz,120Hz, 1kHz

Performance characteristics
4.3-inch TFT LCD display, Chinese and English optional operation interface
Test frequency up to 1MHz
Maximum test speed: 2.3ms/time, with five speed options
Basic accuracy of test capacitor is A 0.07%, loss factor: A 0.0005
Series equivalent inductance Cs-Rs-Ls test technology (TH2638A)
Ultra-stable ESR, 0.001I IC reading resolution
Low impedance test, signal level compensation function
Measurement data can be saved directly to a USB flash drive
Save screenshots to USB drive
Contact check function
Synchronization signal source
The test frequency at 1MHz has an offset function (A 1%, A 2%)


Introduction
The TH2638 series high-speed precision capacitance measuring instrument is a new type of capacitance measuring instrument with a test frequency of up to 1MHz. It is small, compact and portable, and is easy to put on the shelf. The 4.3-inch LCD screen has optional Chinese and English operation interfaces, making operation easy and fast.

The basic accuracy of the TH2638 series for measuring capacitance is A 0.07%, the loss accuracy is as high as 0.0005, and the maximum speed is as high as 2.3ms; the ultra-wide range configuration enables the TH2638 series to accurately measure various types of capacitance from low to high values; ultra-wide output impedance The range and signal level compensation function is particularly suitable for high-speed and high-precision testing of ceramic capacitors with stable test levels; the world's first three-parameter (Cs-RsLs) test function solves the problem of series equivalent of DC-Link film capacitors for new energy vehicles Testing problems of inductor ESL.

The TH2638 series is compatible with the SCPI command set; it has a robot interface and bin classification function, which is suitable for automatic classification of high-speed test products on the production line; a scanner interface with up to 256 scanning channels greatly improves production efficiency; the bad contact inspection function greatly reduces the speed of the production line False positive rate during testing; when the test frequency is 1MHz, the frequency offset setting function (1MHzA 1%, 1MHzA 2%) can eliminate the interference from adjacent measurement terminals in the array capacitor test system and reduce the error of the measurement results. fluctuation.

Corresponding test fixtures can be customized for customers based on DC-Link film capacitors of different sizes.

Application
High-speed and high-precision testing of electrolytic capacitors
High-speed and high-precision testing of ceramic capacitors
High-speed and high-precision testing of film capacitors
High-speed testing of various capacitor production lines
High-speed automated production line integration testing