
Loaded Board Test Probe Cpm-5
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Product Overview
Key Features
The loaded board test probe is applied for examining the loaded circuit boards. The common testing methods for loaded boards are ICT (In-Circuit Test) and FCT (Function Test). Both methods examine the performance of components and circuit connections to detect the defective components during production. ICT and FCT ensure the loaded circuit boardsa normal operation through assessing connection performance of the testing components at the replicated environment of the future application field and controlling the electrical performance of the components to assess the comprehensive connection of the circuit.
Specification:
1.Recommended min. center:4.2(.165")
2.Full travel: 10(0.393" )
3.Current rating:10A
4.Contact resistance:50mIC
Materials and finishes:
1.Plunger:Brass, Au plated
2.Barrel:Brass, Ni plated
3.Spring:Stainless
Specification:
1.Recommended min. center:4.2(.165")
2.Full travel: 10(0.393" )
3.Current rating:10A
4.Contact resistance:50mIC
Materials and finishes:
1.Plunger:Brass, Au plated
2.Barrel:Brass, Ni plated
3.Spring:Stainless
Employee Count
30
Establishment
1996
Working Days
Monday To Sunday
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Seller Details
Taipei, Taipei Shih / Taipei Hsien
Chunglai Hung Probes
Address
1F.,No. 22, Ln 367, Jianguo Rd, Yingge Dist. Taipei, Taipei Shih / Taipei Hsien, 23941, Taiwan
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