
Thin Film Analysis In The Sem Layerprobe
Price:
Get Latest Price
In Stock
Product Specifications
| Thickness Range | 2 nm - 2000 nm |
| Spatial Resolution | High |
| Measurement Type | Non-destructive |
| Layer Material | Metallic |
| Software Type | SEM analysis |
| Compatibility | SEM |
| Usage | Thin film analysis in SEM for layer thickness and composition measurements from 2nm to 2000nm. |
| Features | Fast analysis, Cost-effective, High resolution, Accurate results, Non-destructive, Multiple layers |
Company Details
Business Type
Manufacturer, Service Provider, Distributor, Supplier
Employee Count
11
Establishment
2012
Working Days
Monday To Sunday
GST NO
27AABCO6283B1ZK
Related Products
More Product From This seller
Seller Details
GST - 27AABCO6283B1ZK
Mumbai, Maharashtra
Accepts only Domestic inquiries
Marketing Manager
Mr Abhijat Saklani
Address
Unit No - 11, Marwah's Complex, Krishnalal Marwah Marg, Mumbai, Maharashtra, 400072, India
Testing & Measuring Equipment in Mumbai
Report incorrect details
























