Marsurf Wi 100

MarSurf WI 100
Art. no. 6355002
High-performance laboratory and QA system
The MarSurf WI 100 is a powerful surface profiler for the three-dimensional measurement and analysis of surfaces contactless, independent of material, and fast.
High-performance laboratory and QA system

The high-end MarSurf WI 100 instrument features an extended working area in xyz direction for especially large sample volumes: Simply operate the adjustment on the side, which can be used to move the additional manual Z-axis, and measure XXL components.
Due to its robust design, the MarSurf WI 100 is not only suitable for use in test and inspection laboratories, but is also ideally equipped for quality assurance in production environments.

Typical measuring tasks

Roughness measurements as per
ISO 4287 & ISO 13565 / ISO 25178
Topography measurements (including volume, wear, tribology)
contour and form (2D, 3D)
pore, particle analysis
defect detection
...

Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, reproducibility, and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design, and quality control areas.

MarSurf WI 100 | Art. no. 6355002Resolutionup to 0.2 (nm) verticalMeasuring speedup to 140 fpsMeasuring principleWhite light interferometer
High-power LED (650 nm / white)

OtherCollision detection in xyz directionPower supplied100 - 240 VSurface parametersISO 4287, ISO 13565, ISO 25178

Variety of applications for our products
Mechanical engineering
Qualification and quantification of the roughness, geometry, and wear volume

Electronic system and semiconductors
Component inspection right down to sub-nanometer range for fault-free products

Medical technology
Quality assurance of medical surfaces in production and the laboratory

Materials science
Optimization of functional features on new surfaces and products

Microsystems technology
Measurement of complex surface geometries of the smallest components with nanometer precision