Ellipsometer In Gurgaon
(11 products)
Ellipsometer - Nondestructive Optical Measurement Device for Thin-Layer Analysis Highly Sensitive Ellipsometry Technique
Accuracy0.1°
FeaturesThin-film analysis High sensitivity Non-destructive Optical measurement Precise results
Power120V
Resolution0.01°
Sample Size100mm
UsageThin film thickness & optical constant measurement
New Age Instruments & Materials Pvt. Ltd.
Gurugram
Spectroscopy Ellipsometer
AccuracyHigh Precision
Dimensions20x30x15 cm (Approx)
FeaturesUV-VIS-IR coverage Accurate results Smart SE option Biochemical analysis Thin film metrology
Measurement TypeEllipsometry
Power100-240V
UsageBiochemical medical chemical pharmaceutical cosmetic geology mineralogy carbon materials life sciences thin film metrology semiconductor analysis
Imaging Ellipsometer
FeaturesQuality range Trusted vendors Optimum quality Solve queries Industry prices
clientsEsteemed
dimensionsNA
materialNA
priceLeading
qualityOptimum
Versatile Spectroscopic Ellipsometer
FeaturesFast Measurement Low Consumption Fast Purging Dual Modes Wide Range Easy Loading
Measurement SpeedVery Fast
Nitrogen ConsumptionLowest
Operation ModesTwo Modes
Purging TimeFast
Sample LoadingFast
Spectroscopic Ellipsometers
Accuracy0.1 nm
Dimensions (Approx.)50x40x30 cm
FeaturesHigh Accuracy Modular Design Low Maintenance Durable System Convenient Controls Automated Operation Prolonged Life
Measurement ModesMultiple
Resolution0.01 nm
SoftwareProprietary
Kumar Scientific Company
Durga Kund, Varanasi
M-2000 Spectroscopic Ellipsometer - Advanced Optical Design Fast Data Acquisition Wide Spectral Range Versatile Thin Film Characterization Tool
Accuracy0.1°
DimensionsVariable
FeaturesFast analysis High accuracy Wide spectral range Versatile tool In-situ monitoring Process control
ModelM-2000
Power120V
TechnologyRCE
Multi Wavelength Ellipsometer - Compact Size Ethernet Interface | Precise Measurement High Accuracy Versatile Use
AccuracyHigh Precision
DimensionsCompact Size
FeaturesPrecise Measurement High Accuracy Versatile Use Reliable Results Easy Operation
InterfaceEthernet
Power Supply5V
ResolutionSub-nanometer
Spectroscopic Ellipsometer - 450-1000 nm & 300-1000 nm Wavelength Range High Durability & Corrosion Resistance | Resolution of 0.1 nm Fast Measurement Speed of 3-10 Seconds Accurate Refractive Index and Extinction Coefficients Analysis
ControllerIncluded
FeaturesHigh Durability Corrosion Resistance High Strength Precise Analysis
Measurement Speed3-10 Seconds
Repeatability70 Nm
Resolution01 Nm
Thickness1Nm...10 M
Indo-french High Tech Equipments
Andheri West, Mumbai
Scientific Spectroscopic Ellipsometer
Dimensions200 x 300 x 150 mm (approx)
FeaturesHigh Sensitivity Accurate Measurement Wide Spectral Range Non-rotating Modulation Liquid Crystal Film Thickness Surface Analysis
Measurement Precision0.1°
Power Requirements100-240V
Spectral Resolution0.5 nm
UsageThin film analysis of materials semiconductor properties analysis optical coatings analysis
Spectroscopic Ellipsometers
Accuracy0.1°
ComplianceISO9001
Dimensions60x50x40cm
FeaturesHigh accuracy Modular design Low maintenance Automatic operation Durable system Convenient controls Long lifespan
MaterialAluminum Steel
Precision0.01°
Spectroscopic Ellipsometer - Thin Film Thickness 1µm to 30µm Large Spectral Range 240-2100nm | Highest Accuracy Modular Design Integrated Software Package
AccuracyHigh
DimensionsVariable
FeaturesHigh accuracy Modular design Thin film analysis Surface analysis Software included
Measurement TypeEllipsometry
SoftwareIntegrated
Spectral Range240-2100 nm
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