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Ellipsometer In Ambala-cantt
(11 products)
Ellipsometer - Nondestructive Optical Measurement Device for Thin-Layer Analysis Highly Sensitive Ellipsometry Technique
Wavelength RangeUV-Vis-NIR
Accuracy0.1°
Resolution0.01°
Sample Size100mm
Weight15kg
Power120V
New Age Instruments & Materials Pvt. Ltd.
Gurugram
Spectroscopy Ellipsometer
Wavelength RangeUV-VIS-IR
Measurement TypeEllipsometry
AccuracyHigh Precision
Dimensions20x30x15 cm (Approx)
Weight15 kg (Approx)
Power100-240V
Imaging Ellipsometer
materialNA
dimensionsNA
vendorTrusted
qualityOptimum
priceLeading
typeImaging
Versatile Spectroscopic Ellipsometer
Wavelength Range147-2100 nm
Measurement SpeedVery Fast
Nitrogen ConsumptionLowest
Purging TimeFast
Sample LoadingFast
Operation ModesTwo Modes
Spectroscopic Ellipsometers
Wavelength Range190-1700 nm
Accuracy0.1 nm
Resolution0.01 nm
Measurement ModesMultiple
SoftwareProprietary
Dimensions (Approx.)50x40x30 cm
Kumar Scientific Company
Durga Kund, Varanasi
M-2000 Spectroscopic Ellipsometer - Advanced Optical Design Fast Data Acquisition Wide Spectral Range Versatile Thin Film Characterization Tool
TypeSpectroscopic
ModelM-2000
TechnologyRCE
Wavelength Range240-1700 nm
Accuracy0.1°
DimensionsVariable
Multi Wavelength Ellipsometer
Wavelength RangeWide Range
AccuracyHigh Precision
ResolutionSub-nanometer
InterfaceEthernet
Power Supply5V
DimensionsCompact Size
Spectroscopic Ellipsometer - 450-1000 nm & 300-1000 nm Wavelength Range High Durability & Corrosion Resistance | Resolution of 0.1 nm Fast Measurement Speed of 3-10 Seconds Accurate Refractive Index and Extinction Coefficients Analysis
Wavelength450-1000 Nm
Thickness1Nm...10 M
Resolution01 Nm
Measurement Speed3-10 Seconds
Repeatability70 Nm
ControllerIncluded
Indo-french High Tech Equipments
Andheri West, Mumbai
Scientific Spectroscopic Ellipsometer
Wavelength RangeVUV to NIR
Measurement Precision0.1°
Spectral Resolution0.5 nm
Dimensions200 x 300 x 150 mm (approx)
Weight15 kg (approx)
Power Requirements100-240V
Spectroscopic Ellipsometers
Wavelength Range190-1700nm
Accuracy0.1°
Precision0.01°
Resolution0.001°
Sample SizeVariable
Weight50kg
Spectroscopic Ellipsometer - Thin Film Thickness 1µm to 30µm Large Spectral Range 240-2100nm | Highest Accuracy Modular Design Integrated Software Package
Measurement TypeEllipsometry
Spectral Range240-2100 nm
Thickness Range1-30 nm
AccuracyHigh
SoftwareIntegrated
UsageThin film and surface analysis in research
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