M-2000 Spectroscopic Ellipsometer - Advanced Optical Design, Fast Data Acquisition, Wide Spectral Range, Versatile Thin Film Characterization Tool

We are engaged in offering excellent quality Ellipsometer to our valuable clients. Ellipsometry is primarily interested in how p- and s- components change upon reflection or transmission in relation to each other. In this manner, the reference beam is part of the experiment. A known polarization is reflected or transmitted from the sample and the output polarization is measured. The change in polarization is the ellipsometry measurement. The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition make it an extremely powerful and versatile tool.

The M-2000 delivers both speed and accuracy. Our patented RCE technology combines Rotating Compensator Ellipsometry with high-speed CCD detection to collect data from the entire spectrum (hundreds of wavelengths) in a fraction of a second with a wide array of configurations.
The M-2000 is the first ellipsometer truly to excel at everything from in-situ monitoring and process control to large-area uniformity mapping and general purpose thin film characterization. Clients can avail this Ellipsometer at industry leading prices from us.