Spectroscopic Ellipsometer - 450-1000 Nm & 300-1000 Nm Wavelength Range, High Durability & Corrosion Resistance | Resolution Of 0.1 Nm, Fast Measurement Speed Of 3-10 Seconds, Accurate Refractive Index And Extinction Coefficients Analysis

Mask Aligner

Spectroscopic Ellipsometer - 450-1000 nm & 300-1000 nm Wavelength Range, High Durability & Corrosion Resistance | Resolution of 0.1 nm, Fast Measurement Speed of 3-10 Seconds, Accurate Refractive Index and Extinction Coefficients Analysis

Thin Film Measurement System - 0.1 nm Resolution , Multi-Layer Stacking Capability Up to 10 Layers, Advanced Algorithms for Defect Detection and Roughness Tolerance

Spin Coater - Up to 8" Wafer Size, 200 Programmable Recipes , No Vacuum Pump Required for Compact Operations

Mass Flow Controller - Durable Design, Accurate Dimensions, Reliable Performance | Expertly Crafted for Optimal Customer Satisfaction

Probe Station - Up to 300mm Size | Manual, Semi-Automatic, and Automatic Variants for Failure Analysis, LED, MEMS, and Advanced Research

PlasCalc-2000 Plasma Monitoring and Control System - Spectral Range 200-1100 nm, Optical Resolution 1.0 nm, SMA 905 Fiber Connector | Analog Output 4x [0-10V], 14 Bit D/A Converter, Plasma Monitoring, Precise Control, Spectral Analysis