Edxrf Analyzers

The EDXRF AnalyzersF using polarized x-rays, see attached comparison. This gives the NEX-CG excellent limits of detection for elements from Na upwards in atomic number. Limits of Detection are in the range of 5 to 10 times better than direct (Non-polarized) excitation EDXRF.

Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of convention direct excitation, sensitivity is further improved. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, result in a spectrometer capable of routine trace element analysis even in difficult sample types.