Si Pin Gold Testing Machine

X-RAY High Performance X-Ray Fluorescence Measuring Instrument for fast and non-destructive Material Analysis and Coating Thickness Measurement Neo ALFA FSDD (MCR) / ALFA SDD / ALFA SI-Pin analysis, user-friendly interface Easy to analyze composition and karat results with one push of a button accurate chemistry and karat results within seconds Designed to be compact, taking up minimum desktop space.with Direct Shooting X-Ray, An attractive Design suitable for the showroom floor.Hallmarking Centre And Tunch Lab.Fast certificate results with PC software. Interior lighting and camera allows continuous sample viewing for Best customer security Easy access to the test results Neo Instrument Co.