
Scanning Probe Measurement System
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Product Specifications
| Compliance | CE, ISO |
| Dimensions | Variable |
| Features | High resolution, Versatile technique, Precise imaging, Approach curves, Feedback mode, Surface mapping |
| Material | Metal, plastic |
| Power | 120V |
| Resolution | Sub-nanometer |
| Usage | Surface analysis, material science, electrochemistry, nanoscience applications. |
| Weight | Variable |
Product Overview
Key Features
Features:
* SECM is a versatile technique adding spatial resolution to applications such as kinetics, biological sensors, catalyst, and corrosion mechanisms.
* Capable of Approach Curves experiments and both feedback mode and generator-collector mode imaging modes
* Can perform constant-distance operation in conjunction with a topographic measurement technique, typically OSP
Company Details
CLASS ONE SYSTEMS S&T PVT. LTD. is listed in Trade India's list of verified sellers offering supreme quality of Battery Test System, Electrochemical Impedance Spectroscopy Analyzer, Fuel Cell Testing Systems, etc. Buy Testing & Measuring Equipment in bulk from us for the best quality products and service.
Business Type
Manufacturer, Supplier
Working Days
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GST NO
07AAECC9265E1ZL
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Seller Details
GST - 07AAECC9265E1ZL
New Delhi, Delhi
CEO
Mr. Rajeev Das
Address
Level 4, Rectangle 1, Commercial Complex D-4, Saket, New Delhi, Delhi, 110017, India
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