
Scanning Probe Measurement System
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Product Overview
Key Features
Features:
* SECM is a versatile technique adding spatial resolution to applications such as kinetics, biological sensors, catalyst, and corrosion mechanisms.
* Capable of Approach Curves experiments and both feedback mode and generator-collector mode imaging modes
* Can perform constant-distance operation in conjunction with a topographic measurement technique, typically OSP
Company Details
Focusing on a customer-centric approach, CLASS ONE SYSTEMS S&T PVT. LTD. has a pan-India presence and caters to a huge consumer base throughout the country. Buy Testing & Measuring Equipment in bulk from CLASS ONE SYSTEMS S&T PVT. LTD. at Trade India quality-assured products.
Business Type
Manufacturer, Supplier
Working Days
Monday To Sunday
GST NO
07AAECC9265E1ZL
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Seller Details
GST - 07AAECC9265E1ZL
New Delhi, Delhi
Ceo
Mr. Rajeev Das
Address
Level 4, Rectangle 1, Commercial Complex D-4, Saket, New Delhi, Delhi, 110017, India
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