Modular Research Afm Corvus
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Product Specifications
| Scan Area | 60x60x15 μm |
| Scanner Type | XYZ stage |
| Xy Resonant Frequency | 1 kHz |
| Z Resonant Frequency | 30 kHz |
| Nonlinearity | <0.1% |
| Sample Positioning Range | 5x5mm |
| Sample Positioning Accuracy | 5 μm |
| Features | High resolution, Versatile modes, Modular design, Precise control, Easy operation, High accuracy, Multiple sensors |
| Main Export Market(s) | Asia, Australia, Central America, North America, South America, Eastern Europe, Western Europe, Middle East, Africa |
Product Overview
Key Features
Owing to our years of industry experience and market understanding, we are leading Manufacturer, Exporter & Supplier of Modular Research AFM Corvus in Tallinn, Harju, Estonia.
Over 30 SPM modes realized:
Contact modes: measurement of normal forces, lateral forces, topography (feedback error), force curves
Tapping modes: non-contact and semi-contact methods, topography (feedback error)
Phase contrast
Jumping Mode
measurement of surface potentials
Scanning Kelvin probe
Spreading resistance
Magnetic and electrical force microscopy
Scan area: 60x60x15 I m
Scanner Type: XYZ stage
Resonant frequency XY - 1 kHz
Resonant frequency Z - 30 kHz
Nonlinearity <0.1%
Availability of optical interference sensors
Range of manual sample positioning: 5N 5mm
The accuracy of manual sample positioning: 5 um
AFM spatial resolution (XY, lateral) <0.1 nm
AFM spatial resolution (Z, vertical) <0.01 nm
Over 30 SPM modes realized:
Contact modes: measurement of normal forces, lateral forces, topography (feedback error), force curves
Tapping modes: non-contact and semi-contact methods, topography (feedback error)
Phase contrast
Jumping Mode
measurement of surface potentials
Scanning Kelvin probe
Spreading resistance
Magnetic and electrical force microscopy
Scan area: 60x60x15 I m
Scanner Type: XYZ stage
Resonant frequency XY - 1 kHz
Resonant frequency Z - 30 kHz
Nonlinearity <0.1%
Availability of optical interference sensors
Range of manual sample positioning: 5N 5mm
The accuracy of manual sample positioning: 5 um
AFM spatial resolution (XY, lateral) <0.1 nm
AFM spatial resolution (Z, vertical) <0.01 nm
Company Details
AFM Probes, Established in 2015 at Tallinn in Harju, is a leading Exporter,Manufacturer,Supplier,Trading Company of Measuring Tools & Equipment in Estonia. AFM Probes is one of Trade India's verified and trusted sellers of listed products. With extensive experience in supplying and trading Modular Research AFM Corvus, AFM Probes has made a reputed name for itself in the market with high-quality Budget Compact Multifunctional AFM - HandyScan, Modular Research AFM Corvus, etc.
Focusing on a customer-centric approach, AFM Probes has a pan-India presence and caters to a huge consumer base throughout the country. Buy Measuring Tools & Equipment in bulk from AFM Probes at Trade India quality-assured products.
Focusing on a customer-centric approach, AFM Probes has a pan-India presence and caters to a huge consumer base throughout the country. Buy Measuring Tools & Equipment in bulk from AFM Probes at Trade India quality-assured products.
Business Type
Exporter, Manufacturer, Supplier, Trading Company
Establishment
2015
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Seller Details
Tallinn, Harju
Name
Mrs. Alissa Loginova
Address
Kristiina 15-214, Tallinn 10131, Estonia Tallinn, Harju, 10131, Estonia
optical micrometer in Tallinn
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