Modular Research Afm Corvus - Scan Area 60x60x15 μM, Xyz Stage Scanner | 30 Spm Modes, <0.1% Nonlinearity, 5 μM Positioning Accuracy
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Product Specifications
| Features | High resolution, Versatile modes, Modular design, Precise control, Easy operation, High accuracy, Multiple sensors |
| Nonlinearity | <0.1% |
| Sample Positioning Accuracy | 5 μm |
| Sample Positioning Range | 5x5mm |
| Scan Area | 60x60x15 μm |
| Scanner Type | XYZ stage |
| Xy Resonant Frequency | 1 kHz |
| Z Resonant Frequency | 30 kHz |
| Main Export Market(s) | Australia, Central America, North America, South America, Eastern Europe, Western Europe, Middle East, Africa, Asia |
Product Overview
Key Features
Owing to our years of industry experience and market understanding, we are leading Manufacturer, Exporter & Supplier of Modular Research AFM Corvus in Tallinn, Harju, Estonia.
Over 30 SPM modes realized:
Contact modes: measurement of normal forces, lateral forces, topography (feedback error), force curves
Tapping modes: non-contact and semi-contact methods, topography (feedback error)
Phase contrast
Jumping Mode
measurement of surface potentials
Scanning Kelvin probe
Spreading resistance
Magnetic and electrical force microscopy
Scan area: 60x60x15 I m
Scanner Type: XYZ stage
Resonant frequency XY - 1 kHz
Resonant frequency Z - 30 kHz
Nonlinearity <0.1%
Availability of optical interference sensors
Range of manual sample positioning: 5N 5mm
The accuracy of manual sample positioning: 5 um
AFM spatial resolution (XY, lateral) <0.1 nm
AFM spatial resolution (Z, vertical) <0.01 nm
Over 30 SPM modes realized:
Contact modes: measurement of normal forces, lateral forces, topography (feedback error), force curves
Tapping modes: non-contact and semi-contact methods, topography (feedback error)
Phase contrast
Jumping Mode
measurement of surface potentials
Scanning Kelvin probe
Spreading resistance
Magnetic and electrical force microscopy
Scan area: 60x60x15 I m
Scanner Type: XYZ stage
Resonant frequency XY - 1 kHz
Resonant frequency Z - 30 kHz
Nonlinearity <0.1%
Availability of optical interference sensors
Range of manual sample positioning: 5N 5mm
The accuracy of manual sample positioning: 5 um
AFM spatial resolution (XY, lateral) <0.1 nm
AFM spatial resolution (Z, vertical) <0.01 nm
Company Details
Established in 2015, AFM Probes has made a name for itself in the list of top suppliers of Measuring Tools & Equipment in India. The supplier company is located in Tallinn, Harju, and is one of the leading sellers of listed products.
AFM Probes is listed in Trade India's list of verified sellers offering supreme quality of Budget Compact Multifunctional AFM - HandyScan, Modular Research AFM Corvus, etc. Buy Measuring Tools & Equipment in bulk from us for the best quality products and service.
AFM Probes is listed in Trade India's list of verified sellers offering supreme quality of Budget Compact Multifunctional AFM - HandyScan, Modular Research AFM Corvus, etc. Buy Measuring Tools & Equipment in bulk from us for the best quality products and service.
Business Type
Exporter, Manufacturer, Supplier, Trading Company
Establishment
2015
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Seller Details
Tallinn, Harju
Name
Mrs. Alissa Loginova
Address
Kristiina 15-214, Tallinn 10131, Estonia Tallinn, Harju, 10131, Estonia
optical micrometer in Tallinn
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