Flash Memory Chip Intelligent Test System

Product description: 1.The Smart Test System YC-N8-NAND is a comprehensive flash memory test system that can be customized to test up to 8 flash particles in parallel. 2.YC-N8-NAND supports a wide range of test patterns and customized test parameters. It provides a one-click basic test flow, highly flexible experimental test, and advanced test flow, and can It provides one-click basic test flow, highly flexible experimental test and advanced test flow, which can realize various functional tests such as remaining life prediction, the real test, data retention and read disturbance of flash memory particles. The test report can be exported quickly and easily after the completion of the test. It provides the most intuitive graphical test data to provide the most accurate reference for flash particle classification and application. It also provides the most accurate reference for flash particle classification and application and enables intelligent grading based on flash particle quality test results. Product specifications: 1.Tested by JEDEC Stand No. 218: Solid State Technology Association B-2016 Solid-State Drive (SSD) Requirements And Endurance Test Motho; Test basis following JEDEC Standard No. 47 NVCE: Solid State Technology Association Stress-TestDriven Qualification of Integrated Circuits; 3Test board design specifications to meet industrial-grade test temperature environment requirements;