Scanning Electron Microscope (Sem)

Name: Scanning Electron Microscope (SEM)
Price: 300 USD
Availability: InStock

Price: 300 USD / Unit

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View Head	Digital display, monitor output
Spare Parts	Sample holders, filaments, aperture strips
Focus System	Automatic and manual focus
Features	High-resolution imaging, energy-dispersive X-ray spectroscopy (EDS) compatibility, variable pressure mode.
Theory	Other, Scanning electron microscopy (SEM) uses a focused electron beam to scan the surface of a specimen, producing high-resolution images by detecting secondary or backscattered electrons.
Drawtube	Binocular
Sensor	High-sensitivity solid state detector
Resolution	3.0 nm at 30 kV
Interface	USB 3.0 / Ethernet
Frame Rate	Up to 30 frames per second (live view)
Focal Distance	8 mm aEUR" 25 mm (adjustable)
Magnification	10x to 300,000x continuous
Dimensions	Approx. 620 x 700 x 800 mm (W x D x H)
Focus Range	Automatic and manual adjustment
Eyepieces	Not applicable (image observed via monitor)
Illumination	Electron Beam (variable current)
Coarse Adjustment Range	Up to 10 mm
Fine Adjustment Range	0.1 mm increments
Working Stage	Motorized X-Y stage, 50 mm A-- 50 mm movement
Still Image Capture Resolution	Up to 4096 x 3072 pixels
Video Capture Resolution	1080p Full HD
Image Format	JPG, TIFF, BMP, PNG
Condenser	Electromagnetic condenser lens system
Light Source	Tungsten filament or LaB6