Control Data Acquisition System

Control Data Acquisition System

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Product Specifications

Displays	Multiple monitors
Computers	Multiple PCs
Software	Custom Software
Network	Ethernet network
Sensors	Various types
Actuators	Multiple Actuators
Materials	Steel and Plastic
Features	Data Acquisition, System Control, High Reliability, Real-time Monitoring, Easy Maintenance, Rapid Response, Stable Operation

Product Overview

Key Features

Company Details

Business Type

Exporter, Manufacturer, Supplier

Employee Count

220

Establishment

1981

Working Days

Monday To Sunday

Certification

ISO 9001 : 2000

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Seller Details

D

Dynaspede Integrated Systems Pvt. Ltd.

4

Rating

Hosur, Tamil Nadu

Deputy Manager- Sales & Marketing

Mr. Sethuretnam K.

Address

Plot No.136-A, Sipcot Industrial Complex, Hosur, Tamil Nadu, 635126, India

data acquisition system in Hosur

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Compare With Similar Products

Product Name

Control Data Acquisition System

Data Acquisition System

SPATIAL WAFERMAP

Buyer Feedback

4

3

4

Minimum Order Quantity

1 Unit/Units

1 Unit/Units

IP Rating

IP20

IP20

Output

Standard Data Interface (USB, Ethernet, etc.)

Graphical spatial wafer map

Color

Gray

White and Blue

Interface

USB, Ethernet, RS232

USB, LAN, RS-232

Resolution

16-bit / 24-bit

1280 x 800 pixels

Power Source

AC Mains

External Adapter

Processor Speed

1.8 GHz or Higher

1.6 GHz

Usage

For Laboratory

Wafer inspection and analysis

Input

Analog/Digital Signals

Wafer map data files

Components

Main Unit, Interface Cables, Power Adapter

Sensing module, display, interface board

Operating Temperature

0AdegC to 50AdegC

10C to 40C

Power Supply

AC Powered

External AC/DC Adapter

Display Type

Other, LED / LCD Display

Other, LCD touchscreen

Response Time

< 1 ms

<2 s

Sensors Specification

Compatible with Temperature, Pressure, Flow, and Voltage Sensors

High accuracy position sensors

Features

High Accuracy, Multi-Channel, Modular

Real-time mapping, defect detection, data export

Product Type

Data Acquisition System

Wafer Map Analyzer

Application

Industrial and Laboratory Data Monitoring

Semiconductor manufacturing, process control, quality assurance

Rated Voltage

220-440 Volt (V)

5V DC

Supply Voltage

220-440 V

100-240V AC

Size

Compact

Portable desktop module

Dimension (L*W*H)

Approx. 300 x 200 x 70 mm

320 mm x 210 mm x 80 mm

Function

Collects, monitors, and records real-time data from various sensors and transducers

Semiconductor wafer mapping and visualization

Weight

1-5 Kilograms (kg)

2.5 kg

Thickness

Standard (As per Model)

Standard: 10 mm

Capacity

Multi-Channel

Supports up to 12-inch wafers

Current Rating

2A

0.5A

Frequency

50-60 Hz

50/60 Hz

Sold By

Dynaspede Integrated Systems Pvt. Ltd.
Hosur, Tamil Nadu

Digitron Automation
Pune, Maharashtra

Yesonbiz
Seoul, Seoul

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