Boundary Scan Controller

Description:

QT900 Qscan Test system is designed to provide test solution for both Boundary Scan compliance devices and Non Boundary Scan devices. The System provided with Digital IOs capable of driving and receiving via JTAG IEEE 1149 standard interface and synchronous to JTAG pins. Both Digital and JTAG test are carried out synchronously. Use of virtual test pin and Edge connector eliminates the need of expensive test fixture strategy.

Key Features:

• IEEE 1149 complaint JTAG port
• Boundary Scan controller synchronous digital IO channels
• End to End functional test
• Individually configurable bi directional IO pins
• Standard and user configurable set palettes.
• User code and Device code verification

• Out circuit functional testing of IC''''s using Qmax Library.

  User Segments:

  • In-House maintenance wings of Defense Establishments.
  • Electronic manufacturing units for Board recovery and Production line testing.
  • Transportation sector such as MRTs, Railways, Aircraft, MROs and Marine PCBs of Ships etc.
  • Hi-tech Defense / Atomic /Space labs and R&D labs for maintenance of sophisticated instrumentation/equipment.
  • Useful as Lad Equipment in Test Engineering Courses offered by Universities, technical educational institutions ,Engineering Colleges and Polytechnics
  • Electronic Test and Repair shops.
  • Electronic Manufacturing service (EMS) companies.
  • R & D Labs.