Multi Physics Utility Bore Size: 140.00 Mm

Multi Physics UtilityThe Multi-Physics Utility* is designed to be used in conjunction with any of RSofts passive device simulation tools. It provides a convenient interface from which perturbations of the refractive index profile of a structure may be included in the simulation. These perturbations can be due to advanced physical processes in the material, such as electro-optic effects, thermo-optic effects, stress-optic effects (i.e., strain), and carrier-induced effects. All material parameters needed to describe these effects can be defined in the RSoft Material Library.Applications Electro-absoptive/electro-refractive modulatorsThermo-optic switchesElectrically biased modulatorsBirefringence in waveguides and fibersStress effects caused by cooling during device fabricationSilicon photonic transport modeling FeaturesFully integrated with all RSoft passive device simulation toolsLeverages the RSoft material library for all model parametersComputes index perturbation by solving Poissons equation (electro-optic effect), thermal equation (thermo-optic effect), stress-strain equation (stress effect), and by using LaserMOD to model carrier-based effectsAutomated parametric studies and design optimization using MOST (page 24)Carrier-based effects include fully comprehensive transport and recombination-based models, as well as a large semiconductor and silicon-based material libraryThe basic Multi-Physics Utility with electro-optic and thermo-optic effects is included with all passive device tools; the stress and carrier effects are offered as options that are licensed separately.