These Proforma 300SA Wafer Thickness and Shape Measurement Tool is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 150 to 300 mm. wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow

These Proforma 200SA Wafer Thickness and Shape Measurement Tools is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 75 to 200 mm. wafers, the 200SA provides highly accurate, repeatable measurements of thickness, TTV, bow

We are instrumental in trading a qualitative range of Measuring Tools including Proforma 300sa Wafer Thickness And Shape Measurement Tool, Proforma 200SA Wafer Thickness and Shape Measurement Tools etc.

MTI Instruments - Exporter of Measuring Tools, Proforma 300 Wafer Metrology Tool for Wafer Thickness, TTV and Bow Measurements, Proforma 200SA Wafer Thickness and Shape Measurement Tools from Albany, New York, United States.

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Proforma 300sa Wafer Thickness And Shape Measurement Tool

Proforma 200SA Wafer Thickness and Shape Measurement Tools