Energy Dispersive X-ray Fluorescence (Ed-xrf)

Supported by a team of skilled and experienced professionals, we manufacture, import, trade and supply a wide array of Energy Dispersive X-Ray Fluorescence (ED-XRF) in New Delhi, Delhi, India.
FISCHER Energy Dispersive X-ray Fluorescence (ED-XRF) Measuring System is ideally suited for the fast, non-destructive and accurate measurement of coating thickness & material analysis. Measuring method is Energy Dispersive X-ray Fluorescence (ED-XRF). Coating thickness measurement and material analysis can be performed simultaneously. Measurement results with great accuracy, short analysis time- 30 to 60 seconds, detection of non-homogeneous (micro analysis) is possible. Elements can be detected from Titanium (Z=22) to Uranium (Z=92) with proportional counter detector and from Aluminum (Z=13) to Uranium (Z=92) with semiconductor detector. Provides automatic analysis of completely unknown samples. Differentiates between solid-alloys and coatings. Solids, paste and liquids can be measured. Fischer offers wide range of XRF instruments to meet the varying needs of customers like automated XY and Z axis, big chamber sizes, multiple collimators and filters etc. Clients can avail this Energy Dispersive X-Ray Fluorescence (ED-XRF) at industry leading prices from us.