X-Ray Equipment Manufacturers & Suppliers

For nearly 25 years, HELMUT FISCHER has been developing, manufacturing and distributing X-ray fluorescence instruments for coating thickness measurement and material analysis.

Principle - X-ray Fluorescence Method :
X-ray fluorescence spectral analysis identifies elements through their characteristic secondary X-radiation. An X-ray tube generates primary radiation, which is directed onto the specimen. The primary radiation can knock an electron out of an electron shell of an atom of the specimen material. For energy reasons, an electron from a more distant shell “drops” into the vacated space. In the course of this change in position, the atom emits radiation with an energy that is characteristic of the particular element. This radiation is analyzed with a suitable detector. The energy is used to determine the respective element, and the intensity to determine its quantity in the specimen. The sophistication of the FISCHERSCOPE X-RAY and unique WinFTM software simplifies the complex process making analysis easy, even for users with no specific knowledge of these processes.

The FISCHERSCOPE X-RAY is the first energy-dispersive X-ray fluorescence spectrometer which allows for a fast, non-destructive, cost efficient and precise determination of both quantitative element analysis and thickness measurement in one integrated measurement system.