X Strata Series XRF Analyzer X-Strata is an XRF analyzer for measurement of multilayer coating thickness and/or material composition of platings, coatings and films, containing elements from Ti through U. X- Strata960 is fast and accurate with superior performance. Multi-layer thickness analysis with common elements correction Composition analysis of up to 15 elements simultaneously Measurement method according to ISO 3497, ASTM B568 and DIN 50987 Distance independent mode for measurement of odd shaped samples with one calibration Easy operation Automatic spectrum calibration Small

Twin X New Bench Top EDXRF Spectrometer Twin-X is the result of combining two proven detector technologies to give unprecedented versatility and performance in one compact instrument. Each detector is highly tuned for a specific group of elements on the periodic table. The patented 'Focus 5+' outperforms PIN detectors on low atomic number elements such as Na, Mg, Al, P, S, Cl, K, Ca, etc. The PIN detector focuses on the analysis of complex metal matrices. The PIN detector delivers high sensitivity and resolution for higher atomic number elements such as Cr, Mn, Fe, Co, Ni, Cu, Zn, etc. Tw

MDX1000 Combined ED WD XRF Analyzer The MDX1000 is a Multi Dispersive XRF Spectrometer designed to meet the demand for a reliable system for Research studies and routine process analysis. It offers low running costs without sacrificing performance. The flexibility of Energy Dispersive XRF combined with the accuracy of Wavelength Dispersive XRF results in low detection limits and high stability. The added advantage of no moving parts for simultaneous measurement and excellent XRF tube life, make for a valuable analysis tool WDXRF or EDXRF detection options Element Range: F to U Simulta

Lab X3500 XRF Analyzer The Lab-X3500 is a robust and reliable bench top XRF analyzer for cost-effective Quality Control with a proven track record in over 80 countries world-wide. Lab-X3500 is designed to perform under the most demanding conditions in the laboratory, at-line, or on-site. Easily programmed instrument parameters, flexible software and minimum sample preparation make the Lab-X3500 the ideal choice for any work place. Simple, 'one-touch' operation Element range Mg to U, multi-element capability Analysis range from ppm to 100% Solids, liquids, powders, granules, papers,

ED2000 High Resolution EDXRF Analyzer The highest resolution EDXRF system offers powerful performance for the rapid elemental quantification of applications in Production, Research & Development, Environmental and Forensic analysis. You have a choice of analysis with ED2000: Qualitative, Semi quantitative or Quantitative analyses, with consistent results with lowest detection limits. ED2000 is easy to use, requires little or no sample preparation and its user interface can be customized via XpertEaseĀ® software. Special features of XpertEase include pre-programmed analytical parameter